Fault diagnosis of analog integrated circuits

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TextSeries: Frontiers in electronic testingPublication details: New Delhi: Springer, 2008Description: ix, 182 p.; ill.: 23 cmISBN:

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Cover image	Item type	Current library	Home library	Collection	Shelving location	Call number	Materials specified	Vol info	URL	Copy number	Status	Notes	Date due	Barcode	Item holds	Item hold queue priority	Course reserves
	Books	DAU				621.3815 KAB					Available			020667

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