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Chao, Tien-Hsin

Optical pattern recognition XVIII : 9-10 April 2007, Orlando, Florida, USA - Bellingham: SPIE, 2007 - vii, 1 v. (various pagings); ill.: 28 cm. - Proceedings of SPIE--the International Society for Optical Engineering .

ISBN: 9780819466969 (pbk)

Subjects--Topical Terms:
Optical pattern recognition -- Congresses
SPIE

Dewey Class. No.: 006.42 / CAS