Hurst, Stanley L.

VLSI testing : digital and mixed analogue/digital techniques - London: IEE Publishing, 1998 - xx, 532 p.; ill., index: 24 cm. - Circuits deices and systems systems series .

9780852969014 (hbk)


Integrated circuits -- Very large scale integration -- Testing
Very large scale integration
VLSI

621.395 / HUR

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