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Kelly, Joe

Advanced production testing of RF, SoC, and SiP devices - Boston: Artech House, 2007 - xx, 301 p.; ill.: 24 cm.

ISBN: 9781580537094 (hbk)

Subjects--Topical Terms:
Radio frequency
Semiconductors -- Testing
Systems on a chip -- Testing

Dewey Class. No.: 621.3815 / KEL