Bushnell, Michael L.

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits - New York: Springer, 2000 - xviii, 690 p.; ill.: 24 cm. - Frontiers in electronic testing .

0792379918 (pbk)


Digital integrated circuits -- Testing
Integrated circuits -- Very large scale integration -- Testing
Mixed signal circuits -- Testing
Semiconductor storage devices -- Testing

621.395 / BUS

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