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VLSI test principles and architectures : design for testability (Record no. 11561)

MARC details
000 -LEADER
fixed length control field 00683nam a2200193Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 161214s9999 xx 000 0 und d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9780123705976
Terms of availability (hbk)
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.395
Item number WAN
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Wu, Cheng-Wen
245 #0 - TITLE STATEMENT
Title VLSI test principles and architectures : design for testability
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc Amsterdam:
Name of publisher, distributor, etc Elsevier,
Date of publication, distribution, etc 2006
300 ## - PHYSICAL DESCRIPTION
Extent xxx, 777 p.;
Other physical details ill.:
Dimensions 24 cm.
490 ## - SERIES STATEMENT
Series statement The Morgan Kaufmann series in systems on silicon
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Integrated circuits -- Very large scale integration -- Design
Topical term or geographic name as entry element Integrated circuits -- Very large scale integration -- Testing
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Wang, Laung-Terng
Personal name Wen, Xiaoqing
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Dewey Decimal Classification
Item type Books
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Home library Current library Date acquired Source of acquisition Cost, normal purchase price Total Checkouts Total Renewals Full call number Barcode Date last seen Date last borrowed Koha item type
    Dewey Decimal Classification     DAU DAU 04/04/2008 Baroda Book Corporation 0.00 10 1 621.395 WAN 019158 23/03/2024 23/03/2024 Books