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Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale. Volume I

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BookPublisher: New York: Springer, 2007Description: 2 vol.; ill.: 24 cm.ISBN: 9780387286679 .Subject(s): Nanoelectronics | Scanning probe microscopyDDC classification: 502.825

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Item type	Current location	Call number	Status	Date due	Barcode
Books		502.825 KAL (Browse shelf)	Available		023747
Books		502.825 KAL (Browse shelf)	Available		023746

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Previous	502.825 BAI Scanning tunneling microscopy and its applications	502.825 GNE Nanoscale processes on insulating surfaces	502.825 KAL Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale. Volume I	502.825 KAL Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale. Volume I	502.825 SAR Exploring scanning probe microscopy with MATHEMATICA	502.825 SAR Exploring scanning probe microscopy with MATHEMATICA	502.85 BAI Performance tuning of scientific applications	Next

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