Digital systems testing and testable design
By: Breuer, Melvin.
Contributor(s): Friedman, Arthur D.
Material type:
BookPublisher: New York: IEEE, 1990Description: xvii, 652 p.; ill., index: 26 cm.ISBN: 9780780310629 .Subject(s): Digital integrated circuits -- Design and construction | Digital integrated circuits -- TestingDDC classification: 621.395
| Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
| Books | 621.395 ABR (Browse shelf) | Available | 009327 |
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