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Abstraction refinement for large scale model checking.

By: Wang, Chao.
Contributor(s): Hachtel, Gary D | Somenzi, Fabio.
Material type: materialTypeLabelBookSeries: Series on integrated circuits and systems.Publisher: New York: Springer, 2006Description: xii, 179 p.; ill.: 24 cm.ISBN: 0387341552 .Subject(s): Computer systems | Electronic systems | Integrated circuits | Abstraction | Refinement | Image ComputationDDC classification: 004.21
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