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High performance memory testing : design principles, fault modeling, and self-test

By: Adams, R. Dean.
Material type: materialTypeLabelBookSeries: Frontiers in electronic testing.Publisher: Boston: Kluwer Academic, 2002Description: vii, 246 p.; ill., index: 24 cm.ISBN: 1402072554 .Subject(s): Computer storage devices -- Testing | Frontiers in electronic testing | Semiconductor storage devices -- TestingDDC classification: 621.39732
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Item type Current location Call number Status Date due Barcode
Books 621.39732 ADA (Browse shelf) Available 008648

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