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Digital systems testing and testable design

By: Abramovici, Miron.
Contributor(s): Breuer, Melvin A | Friedman, Arthur D.
Material type: materialTypeLabelBookPublisher: New Delhi: Jaico Publishing House, 2001Description: xviii, 652 p.; ill.: 25 cm.ISBN: 8172248911 .Subject(s): Digital integrated circuits -- Design and construction | Digital integrated circuits -- Testing | Electronic equipment TestingDDC classification: 621.3815
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