1. Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

by Bushnell, Michael L | Agrawal, Vishwani D.

Material type: book Book; Format: print ; Literary form: Not fiction Publisher: New York: Springer, 2000Availability: Items available for loan: [Call number: 621.395 BUS] (5).
2. Analog and mixed-signal boundary-scan : a guide to the IEEE 1149.4 test standard

by Osseiran, Adam.

Material type: book Book; Format: print ; Literary form: Not fiction Publisher: Boston: Kluwer Academic Publishers, 1999Availability: Items available for loan: [Call number: 621.381548 OSS] (1).
3. DSP-based testing of analog and mixed-signal circuits

by Mahoney, Matthew.

Material type: book Book; Format: print ; Literary form: Not fiction Publisher: Washington: Wiley-IEEE Press, 1987Availability: Items available for loan: [Call number: 620.0044 MAH] (1).

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