Koha online catalog › Results of search for 'su:"Semiconductors -- Testing"'

	1.	Semiconductor material and device characterization by Schroder, Dieter K. Edition: 3rd ed.Material type: Book; Format: print ; Literary form: Not fiction Publisher: New Jersey: Wiley-Interscience, 2006Availability: Items available for loan: [Call number: 621.38152 SCH] (1). Place hold
	2.	Semiconductor devices and circuits by Dutta, Aloke. Material type: Book; Format: print ; Literary form: Not fiction Publisher: New Delhi: Oxford University Press, 2008Availability: Items available for loan: [Call number: 621.38152 DUT] (3). Place hold
	3.	Advanced production testing of RF, SoC, and SiP devices by Kelly, Joe \| Engelhardt, Michael. Material type: Book; Format: print ; Literary form: Not fiction Publisher: Boston: Artech House, 2007Availability: Items available for loan: [Call number: 621.3815 KEL] (1). Place hold

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