1. Test resource partitioning for system-on-a-chip

by Chakrabarty, Krishnendu | Chandra, Anshuman | Iyengar, Vikram.

Material type: book Book; Format: print ; Literary form: Not fiction Publisher: Boston: Kluwer Academic Publishers, 2002Availability: Items available for loan: [Call number: 621.3916 CHA] (1).
2. Advanced production testing of RF, SoC, and SiP devices

by Kelly, Joe | Engelhardt, Michael.

Material type: book Book; Format: print ; Literary form: Not fiction Publisher: Boston: Artech House, 2007Availability: Items available for loan: [Call number: 621.3815 KEL] (1).

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