000 00466nam a2200157Ia 4500
008 161214s9999 xx 000 0 und d
020 _a9780070542730
_c(hbk)
082 _223
_a537.622
_bRUN
100 _aRunyan, W. R.
245 0 _aSemiconductor measurements and instrumentation
260 _aNew York:
_bMcGraw-Hill,
_c1975
300 _avii, 280 p.;
_bill.:
_c26 cm.
490 _aTexas Instruments electronics series
650 _aSemiconductors
942 _2ddc
_cBK
999 _c10595
_d10595