000			00667nam a2200193Ia 4500
008			161214s9999 xx 000 0 und d
020			_a9780387717531 _c(hbk)
082			_223 _a621.38223 _bALI
100			_aAliev, Telman
245		0	_aDigital noise monitoring of defect origin
260			_aNew York: _bSpringer, _c2007
300			_axii, 223 p.; _bill.: _c24 cm.
490			_aLecture notes in electrical engineering
650			_aDefect correction methods (Numerical analysis)
650			_aElectronic noise -- Mathematical models
650			_aInformation storage and retrieval systems -- Materials -- Defects
650			_aSignal detection
942			_2ddc _cBK
999			_c14771 _d14771