000			00543nam a2200169Ia 4500
008			161214s9999 xx 000 0 und d
020			_a9780780310629 _c(hbk)
082			_223 _a621.395 _bABR
100			_aBreuer, Melvin
245		0	_aDigital systems testing and testable design
260			_aNew York: _bIEEE, _c1990
300			_axvii, 652 p.; _bill., index: _c26 cm.
650			_aDigital integrated circuits -- Design and construction
650			_aDigital integrated circuits -- Testing
700			_aFriedman, Arthur D.
942			_2ddc _cBK
999			_c18696 _d18696