| 000 | 00496nam a2200169Ia 4500 | ||
|---|---|---|---|
| 008 | 161214s9999 xx 000 0 und d | ||
| 020 |
_a0471739065 _c(hbk) |
||
| 082 |
_223 _a621.38152 _bSCH |
||
| 100 | _aSchroder, Dieter K. | ||
| 245 | 0 | _aSemiconductor material and device characterization | |
| 250 | _a3rd ed. | ||
| 260 |
_aNew Jersey: _bWiley-Interscience, _c2006 |
||
| 300 |
_axv, 779 p.; _bill.: _c24 cm. |
||
| 650 | _aSemiconductors | ||
| 650 | _aSemiconductors -- Testing | ||
| 942 |
_2ddc _cBK |
||
| 999 |
_c2761 _d2761 |
||