000			00708nam a2200193Ia 4500
008			161214s9999 xx 000 0 und d
020			_a0792386868 _c(hbk)
082			_223 _a621.381548 _bOSS
100			_aOsseiran, Adam
245		0	_aAnalog and mixed-signal boundary-scan : a guide to the IEEE 1149.4 test standard
260			_aBoston: _bKluwer Academic Publishers, _c1999
300			_axviii, 155 p.; _bill.: _c25 cm.
490			_aFrontiers in electronic testing
650			_aBoundary scan testing
650			_aElectronic digital computers -- Circuits -- Design and construction
650			_aMixed signal circuits -- Testing
650			_aPrinted circuits -- Testing -- Standards
942			_2ddc _cBK
999			_c4006 _d4006