000			00632nam a2200181Ia 4500
008			161214s9999 xx 000 0 und d
020			_a1402072554 _c(hbk)
082			_223 _a621.39732 _bADA
100			_aAdams, R. Dean
245		0	_aHigh performance memory testing : design principles, fault modeling, and self-test
260			_aBoston: _bKluwer Academic, _c2002
300			_avii, 246 p.; _bill., index: _c24 cm.
490			_aFrontiers in electronic testing
650			_aComputer storage devices -- Testing
650			_aFrontiers in electronic testing
650			_aSemiconductor storage devices -- Testing
942			_2ddc _cBK
999			_c4767 _d4767