| 000 | 00644nam a2200205Ia 4500 | ||
|---|---|---|---|
| 008 | 161214s9999 xx 000 0 und d | ||
| 020 |
_a9812563954 _c(hbk) |
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| 082 |
_223 _a621.38152 _bLEV |
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| 100 | _aLevinshtein, Michael | ||
| 245 | 0 | _aBreakdown phenomena in semiconductors and semiconductor devices | |
| 260 |
_aNew Jersey: _bWorld Scientific, _c2005 |
||
| 300 |
_axiii, 208 p.; _bill.: _c25 cm. |
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| 490 | _aSelected topics in electronics and systems | ||
| 650 | _aBreakdown (Electricity) | ||
| 650 | _aHigh voltages | ||
| 650 | _aSemiconductors | ||
| 700 | _aKostamovaara, Juha | ||
| 700 | _aVainshtein, Sergey | ||
| 942 |
_2ddc _cBK |
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| 999 |
_c9916 _d9916 |
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