Aliev, Telman
Digital noise monitoring of defect origin
- New York: Springer, 2007
- xii, 223 p.; ill.: 24 cm.
- Lecture notes in electrical engineering .
9780387717531 (hbk)
Defect correction methods (Numerical analysis)
Electronic noise -- Mathematical models
Information storage and retrieval systems -- Materials -- Defects
Signal detection
621.38223 / ALI