Digital noise monitoring of defect origin
By: Aliev, Telman.
Material type:
BookSeries: Lecture notes in electrical engineering.Publisher: New York: Springer, 2007Description: xii, 223 p.; ill.: 24 cm.ISBN: 9780387717531 .Subject(s): Defect correction methods (Numerical analysis) | Electronic noise -- Mathematical models | Information storage and retrieval systems -- Materials -- Defects | Signal detectionDDC classification: 621.38223
| Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
| Books | 621.38223 ALI (Browse shelf) | Available | 017742 |
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