Moyne, James

Run-to-run control in semiconductor manufacturing - Boca Raton : CRC Press, 2001 - 348 p. ; ill. (some b & w), 24 cm.

Includes bibliographical references and index.

Offers analyses of run-to-run (R2R) control. Through manufacturing case studies, this book provides justification for and demonstrates the benefits of run-to-run control, and offers the know-how and direction for incorporating R2R control into readers' manufacturing capabilities.

9780849311789


Electronic packaging
Semiconductor industry
Production control
EWMA controller
Process control
Semiconductor manufacturing;
Optimization Methods
Basic R2R Control Algorithms
Furnace Capability Improvement
Process Recipe Optimization

621.38152 / MOY

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