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Fault-tolerance and reliability techniques for high-density random-access memories

Chakraborty, Kanad

Fault-tolerance and reliability techniques for high-density random-access memories - New Delhi: Prentice Hall of India, 2002 - xix, 426 p.; ill.: 24 cm.

8120322142 (pbk)


Integrated circuits -- Fault tolerance
Random access memory -- Reliability
Semiconeductor storage devices

621.3973 / CHA