Fault-tolerance and reliability techniques for high-density random-access memories
By: Chakraborty, Kanad.
Contributor(s): Mazumder, Pinaki.
Material type:
BookPublisher: New Delhi: Prentice Hall of India, 2002Description: xix, 426 p.; ill.: 24 cm.ISBN: 8120322142 .Subject(s): Integrated circuits -- Fault tolerance | Random access memory -- Reliability | Semiconeductor storage devicesDDC classification: 621.3973
| Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
| Books | 621.3973 CHA (Browse shelf) | Available | 013858 |
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