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Authors
Chakraborty, Kanad
Maiti C.K.
Maiti T.K.
Mazumder, Pinaki
Item types
Books
Topics
Bias temperature ins...
Electron mobility
Strain
Threshold voltage
Valance band
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Your query retrived 2 records.
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1.
Fault-tolerance and reliability techniques for high-density random-access memories
by
Chakraborty, Kanad
|
Mazumder, Pinaki.
Material type:
Book
; Format:
print
; Literary form:
Not fiction
Publisher:
New Delhi: Prentice Hall of India, 2002
Availability:
Items available for loan:
[
Call number:
621.3973 CHA] (1).
Place hold
2.
Strain-engineered MOSFETs
by
Maiti C.K
|
Maiti T.K.
Publisher:
2013 Taylor and Francis Group, Boca Raton
Availability:
Items available for loan:
[
Call number:
621.3815284 MAI] (1).
Place hold
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