1. Fault-tolerance and reliability techniques for high-density random-access memories

by Chakraborty, Kanad | Mazumder, Pinaki.

Material type: book Book; Format: print ; Literary form: Not fiction Publisher: New Delhi: Prentice Hall of India, 2002Availability: Items available for loan: [Call number: 621.3973 CHA] (1).
2. Strain-engineered MOSFETs

by Maiti C.K | Maiti T.K.

Publisher: 2013 Taylor and Francis Group, Boca RatonAvailability: Items available for loan: [Call number: 621.3815284 MAI] (1).

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