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Java/j2ee testing patterns

Young, Matthew

Java/j2ee testing patterns - New Delhi: Wiley-Dreamtech India, 2004 - xv, 400 p.; : 24 cm.

ISBN: 8126505559 (pbk)

Subjects--Topical Terms:
Computer software -- Development
Computer software -- Testing
J2EE
Java (Computer program language)
Software patterns

Dewey Class. No.: 005.133 / THO

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