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Java/j2ee testing patterns

By: Young, Matthew.
Contributor(s): Brown, Kyle | Grover, Andrew | Thomas, Jon.
Material type: materialTypeLabelBookPublisher: New Delhi: Wiley-Dreamtech India, 2004Description: xv, 400 p.; : 24 cm.ISBN: 8126505559 .Subject(s): Computer software -- Development | Computer software -- Testing | J2EE | Java (Computer program language) | Software patternsDDC classification: 005.133
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Item type Current location Call number Status Date due Barcode
Books 005.133 THO (Browse shelf) Available 012376

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