Process engineering analysis in semiconductor device fabrication
By: Middleman, Stanley.
Contributor(s): Hochberg, Arthur K.
Material type:
BookSeries: McGraw-Hill chemical engineering series.Publisher: New York: McGraw-Hill, 1993Description: xvii, 774 p.; ill.: 25 cm.ISBN: 9780070418530 .Subject(s): Semiconductors : Design and constructionDDC classification: 621.38152
| Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
| Books | 621.38152 MID (Browse shelf) | Available | 025202 |
Browsing DAIICT Shelves Close shelf browser
| 621.38152 MAR Essentials of semiconductor device physics | 621.38152 MAY Fundamentals of semiconductor fabrication | 621.38152 MIC Single semiconductor quantum dots | 621.38152 MID Process engineering analysis in semiconductor device fabrication | 621.38152 MOY Run-to-run control in semiconductor manufacturing | 621.38152 NAG Microelectronic devices | 621.38152 NAG Microelectronic devices |
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