Digital systems testing and testable design
By: Breuer, Melvin.
Contributor(s): Friedman, Arthur D.
Material type:
BookPublisher: New York: IEEE, 1990Description: xvii, 652 p.; ill., index: 26 cm.ISBN: 9780780310629 .Subject(s): Digital integrated circuits -- Design and construction | Digital integrated circuits -- TestingDDC classification: 621.395
| Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
| Books | 621.395 ABR (Browse shelf) | Available | 009327 |
Browsing DAIICT Shelves Close shelf browser
| 621.392 YAL VHDL : a starter's guide | 621.392 ZEI Verilog Designer's Library | 621.392 ZEI Verilog Designer's Library | 621.395 ABR Digital systems testing and testable design | 621.395 AHM Handbook of energy-aware and green computing | 621.395 AHM Handbook of energy-aware and green computing | 621.395 ALH System-on-chip : next generation electronics |
There are no comments for this item.