Built-in test for VLSI : pseudorandom techniques
By: Bardell, Paul H.
Contributor(s): McAnney, William H | Savir, Jacob.
Material type:
BookPublisher: New York: John Wiley & Sons, 1987Description: xiii, 354 p.; ill.: 24 cm.ISBN: 0471624632 .Subject(s): Integrated circuits -- Very large scale integration -- TestingDDC classification: 621.38173
| Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
| Books | 621.38173 BAR (Browse shelf) | Available | 023793 |
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