Koha online catalog › Results of search for 'su:"Integrated circuits -- Very large scale integration -- Testing"'

	1.	Built-in test for VLSI : pseudorandom techniques by Bardell, Paul H \| McAnney, William H \| Savir, Jacob. Material type: Book; Format: print ; Literary form: Not fiction Publisher: New York: John Wiley & Sons, 1987Availability: Items available for loan: [Call number: 621.38173 BAR] (1). Place hold
	2.	Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits by Bushnell, Michael L \| Agrawal, Vishwani D. Material type: Book; Format: print ; Literary form: Not fiction Publisher: New York: Springer, 2000Availability: Items available for loan: [Call number: 621.395 BUS] (5). Place hold
	3.	VLSI test principles and architectures : design for testability by Wu, Cheng-Wen \| Wang, Laung-Terng \| Wen, Xiaoqing. Material type: Book; Format: print ; Literary form: Not fiction Publisher: Amsterdam: Elsevier, 2006Availability: Items available for loan: [Call number: 621.395 WAN] (1). Place hold
	4.	VLSI testing : digital and mixed analogue/digital techniques by Hurst, Stanley L. Material type: Book; Format: print ; Literary form: Not fiction Publisher: London: IEE Publishing, 1998Availability: Items available for loan: [Call number: 621.395 HUR] (1). Place hold
	5.	Introduction to place and route design in VLSIs by Lee, Patrick. Material type: Book; Format: print ; Literary form: Not fiction Publisher: Morrisville: Lulu, 2007Availability: Items available for loan: [Call number: 621.395 LEE] (1). Place hold

Koha online