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Authors
Aliev, Telman
Bonani, Fabrizio
Ghione, Giovanni
Item types
Books
Series
Lecture notes in ele...
Springer series in a...
Topics
Defect correction me...
Electronic noise -- ...
Information storage ...
Integrated circuits ...
Semiconductors -- Ma...
Signal detection
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1.
Noise in semiconductor devices : modeling and simulation
by
Bonani, Fabrizio
|
Ghione, Giovanni.
Material type:
Book
; Format:
print
; Literary form:
Not fiction
Publisher:
Berlin: Springer, 2001
Availability:
Items available for loan:
[
Call number:
621.38152 GHI] (1).
Place hold
2.
Digital noise monitoring of defect origin
by
Aliev, Telman.
Material type:
Book
; Format:
print
; Literary form:
Not fiction
Publisher:
New York: Springer, 2007
Availability:
Items available for loan:
[
Call number:
621.38223 ALI] (1).
Place hold
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