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1.
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

by Bushnell, Michael L | Agrawal, Vishwani D.

Material type: book Book; Format: print ; Literary form: Not fiction Publisher: New York: Springer, 2000Availability: Items available for loan: [Call number: 621.395 BUS] (5).
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2.
Analog and mixed-signal boundary-scan : a guide to the IEEE 1149.4 test standard

by Osseiran, Adam.

Material type: book Book; Format: print ; Literary form: Not fiction Publisher: Boston: Kluwer Academic Publishers, 1999Availability: Items available for loan: [Call number: 621.381548 OSS] (1).
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3.
Test resource partitioning for system-on-a-chip

by Chakrabarty, Krishnendu | Chandra, Anshuman | Iyengar, Vikram.

Material type: book Book; Format: print ; Literary form: Not fiction Publisher: Boston: Kluwer Academic Publishers, 2002Availability: Items available for loan: [Call number: 621.3916 CHA] (1).
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4.
High performance memory testing : design principles, fault modeling, and self-test

by Adams, R. Dean.

Material type: book Book; Format: print ; Literary form: Not fiction Publisher: Boston: Kluwer Academic, 2002Availability: Items available for loan: [Call number: 621.39732 ADA] (1).
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5.
Digital timing measurements : from scopes and probes to timing and jitter

by Maichen, Wolfgang.

Material type: book Book; Format: print ; Literary form: Not fiction Publisher: Dordrecht: Springer, 2006Availability: Items available for loan: [Call number: 621.3822 MAI] (1).
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6.
Fault diagnosis of analog integrated circuits

by Kabisatpathy, Prithviraj | Barua, Alok | Sinha, Satyabroto.

Material type: book Book; Format: print ; Literary form: Not fiction Publisher: New Delhi: Springer, 2008Availability: Items available for loan: [Call number: 621.3815 KAB] (1).
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