1. Noise in semiconductor devices : modeling and simulation

by Bonani, Fabrizio | Ghione, Giovanni.

Material type: book Book; Format: print ; Literary form: Not fiction Publisher: Berlin: Springer, 2001Availability: Items available for loan: [Call number: 621.38152 GHI] (1).
2. Digital noise monitoring of defect origin

by Aliev, Telman.

Material type: book Book; Format: print ; Literary form: Not fiction Publisher: New York: Springer, 2007Availability: Items available for loan: [Call number: 621.38223 ALI] (1).

Powered by Koha