Koha online catalog › Results of search for 'su:"Semiconductor storage devices -- Testing"'

	1.	Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits by Bushnell, Michael L \| Agrawal, Vishwani D. Material type: Book; Format: print ; Literary form: Not fiction Publisher: New York: Springer, 2000Availability: Items available for loan: [Call number: 621.395 BUS] (5). Place hold
	2.	High performance memory testing : design principles, fault modeling, and self-test by Adams, R. Dean. Material type: Book; Format: print ; Literary form: Not fiction Publisher: Boston: Kluwer Academic, 2002Availability: Items available for loan: [Call number: 621.39732 ADA] (1). Place hold

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