Normal view MARC view ISBD view

Fundamental principles of engineering nanometrology.

By: Leach, Richard.
Material type: materialTypeLabelBookSeries: Micro and nano technologies.Publisher: Oxford: William Andrew, 2009Description: xxvi, 321 p.; ill.: 24 cm.ISBN: 9780080964546 .Subject(s): Metrology | Microtechnology | NanotechnologyDDC classification: 620.50287
Tags from this library: No tags from this library for this title. Log in to add tags.

Powered by Koha