VLSI test principles and architectures : design for testability
Material type:
TextSeries: The Morgan Kaufmann series in systems on siliconPublication details: Amsterdam: Elsevier, 2006Description: xxx, 777 p.; ill.: 24 cmISBN: - 9780123705976
- 23 621.395 WAN
| Cover image | Item type | Current library | Home library | Collection | Shelving location | Call number | Materials specified | Vol info | URL | Copy number | Status | Notes | Date due | Barcode | Item holds | Item hold queue priority | Course reserves | |
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| Books | DAU | 621.395 WAN | Available | 019158 |
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