High performance memory testing : design principles, fault modeling, and self-test
By: Adams, R. Dean.
Material type:
BookSeries: Frontiers in electronic testing.Publisher: Boston: Kluwer Academic, 2002Description: vii, 246 p.; ill., index: 24 cm.ISBN: 1402072554 .Subject(s): Computer storage devices -- Testing | Frontiers in electronic testing | Semiconductor storage devices -- TestingDDC classification: 621.39732
| Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
| Books | 621.39732 ADA (Browse shelf) | Available | 008648 |
Browsing DAIICT Shelves Close shelf browser
| 621.397 SIE Advances in information recording | 621.397 WAN Magnetic information storage technology | 621.3973 CHA Fault-tolerance and reliability techniques for high-density random-access memories | 621.39732 ADA High performance memory testing : design principles, fault modeling, and self-test | 621.39732 ALL CMOS analog circuit design | 621.39732 ALL CMOS analog circuit design | 621.39732 ALL CMOS analog circuit design |
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