Advanced production testing of RF, SoC, and SiP devices
By: Kelly, Joe.
Contributor(s): Engelhardt, Michael.
Material type:
BookPublisher: Boston: Artech House, 2007Description: xx, 301 p.; ill.: 24 cm.ISBN: 9781580537094 .Subject(s): Radio frequency | Semiconductors -- Testing | Systems on a chip -- TestingDDC classification: 621.3815
| Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
| Books | 621.3815 KEL (Browse shelf) | Available | 016331 |
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