Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
By: Bushnell, Michael L.
Contributor(s): Agrawal, Vishwani D.
Material type:
BookSeries: Frontiers in electronic testing.Publisher: New York: Springer, 2000Description: xviii, 690 p.; ill.: 24 cm.ISBN: 0792379918 .Subject(s): Digital integrated circuits -- Testing | Integrated circuits -- Very large scale integration -- Testing | Mixed signal circuits -- Testing | Semiconductor storage devices -- TestingDDC classification: 621.395
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